Mark Walch

Mark Walch is the President of Sciometrics LLC, where he brings more than 25 years of technical and managerial experience. In this role, Mr. Walch oversees development of a variety of technologies related to the efficient and effective capture of data from images. Mr. Walch is the principal architect of Pictographic pattern-matching methods, and has developed innovative Optical Character Recognition techniques that have been used to read hand print and cursive script for the U.S. Postal Service. Derivatives of these techniques have been used successfully to register independent vector data sets for upgrading map data on behalf of the U.S. Census Bureau. Mr. Walch has also developed several automated techniques for accurate and cost-effective data capture from handwritten and printed forms, and pioneered the concept of “directed workflow”—a method for streamlining the way human operators review large quantities of data. Mr. Walch holds advanced degrees from the University of Michigan and Yale University.